Publication | Year | ||||||||
---|---|---|---|---|---|---|---|---|---|
The Potential of Phosphorene Nanoribbons as Channel Material for Ultrascaled Transistors Authors : Mirko Poljak , Tomislav SuligojJournal : IEEE Transactions on Electron Devices Journal Reference count : 24 Volume : 65 Pages : 290-294 |
2018 | ||||||||
Authors :
Marko Koricic
, Josip Zilak
, Tomislav Suligoj
Journal : IEEE Transactions on Electron Devices Journal Reference count : 10 Volume : 64 Pages : 3019-3022 |
2017 | ||||||||
Quantum Transport Analysis of Conductance Variability in Graphene Nanoribbons With Edge Defects Authors : Mirko Poljak , Tomislav SuligojJournal : IEEE Transactions on Electron Devices Journal Reference count : 31 Volume : 63 Pages : 537-543 |
2016 | ||||||||
Immunity of electronic and transport properties of phosphorene nanoribbons to edge defects Authors : Mirko Poljak , Tomislav SuligojJournal : Nano Research Journal Reference count : 42 Volume : 9 Pages : 1723-1734 |
2016 | ||||||||
Reliability Degradation Mechanisms of Horizontal Current Bipolar Transistor Authors : Josip Zilak , Marko Koricic , Tomislav SuligojJournal : IEEE Transactions on Electron Devices Journal Reference count : 21 Volume : 63 Pages : 4409-4415 |
2016 | ||||||||
Authors :
Sabina Krivec
, Mirko Poljak
, Tomislav Suligoj
Journal : Solid-State Electronics Journal Reference count : 28 Volume : 115 Pages : 109-119 |
2016 | ||||||||
Authors :
Marko Koricic
, Josip Zilak
, Tomislav Suligoj
Journal : IEEE Electron Device Letters Journal Reference count : 9 Volume : 36 Pages : 90-92 |
2015 | ||||||||
Suppression of corner effects in wide-channel triple-gate bulk FinFETs Authors : Mirko Poljak , Vladimir Jovanović , Tomislav SuligojJournal : Microelectronic Engineering Journal Reference count : 19 Volume : 87 Pages : 192-199 |
2010 | ||||||||
Crystallographic Silicon-Etching for Ultra-High Aspect-Ratio FinFET Authors : Vladimir Jovanovic , Tomislav Suligoj , Lis NanverJournal : ECS Transactions Volume : 13 Pages : 313-320 |
2008 | ||||||||
Crystallographic Silicon-Etching for Ultra-High Aspect-Ratio FinFET Authors : Vladimir Jovanovic , Tomislav Suligoj , Lis NanverJournal : ECS Meeting Abstracts Volume : MA2008-01 Pages : 644-644 |
2008 |